FOREX Press I. J. of Electrical & Electronics Research
Support Open Access

Research Article |

Optimized System Level Hardware Realization of Built-in-Self-Test Approach for Sigma-Delta Analog-to-Digital Converter

Author(s): Anil Kumar Sahu*, Vivek Kumar Chandra and G R Sinha

Publisher : FOREX Publication

Published : 30 september 2016

e-ISSN : 2347-470X

Page(s) : 85-90




Anil Kumar Sahu*, Assistant Professor (ETC), Shri Shankaracharaya Technical Campus (SSTC) Bhilai, India; Email: anilsahu82@gmail.com

Vivek Kumar Chandra, Professor and Head (EEE), Chhatrapati Shivaji Institute of Technology, Durg, India; Email: vivekchandra1@rediffmail.com

G R Sinha, Professor (ETC) and Associate Director, SSTC, Bhilai, India; Email: drgrsinha@ieee.org

    [1] Abbes, K., A. Hentati, and M. Masmoudi. "Test and characterization of 1 bit Σ—Δ modulator." In Systems, Signals and Devices, 2008. IEEE SSD 2008. 5th International Multi- Conference on, pp. 1-4. IEEE, 2008.
    [2] Lee, Kuen-Jong, Soon-Jyh Chang, and Ruei-Shiuan Tzeng. "A sigma-delta modulation based BIST scheme for A/D converters." In Test Symposium, 2003. ATS 2003. 12th Asian, pp. 124-127. IEEE, 2003.
    [3] Chouba, Nabil, and Laroussi Bouzaida. "A BIST architecture for sigma delta ADC testing based on embedded NOEB self-test and CORDIC algorithm." InDesign and Technology of Integrated Systems in Nanoscale Era (DTIS), 2010 5th International Conference on, pp. 1-7. IEEE, 2010.
    [4] Damarla, Raju T., Wei Su, Moon J. Chung, Charles E. Stroud, and Gerald T. Michael. "A built-in self test scheme for VLSI." In Design Automation Conference, 1995. Proceedings of the ASP- DAC'95/CHDL'95/VLSI’95. IFIP International Conference onHardware Description Languages. IFIP International Conference on Very Large Scal, pp. 217-222. IEEE, 1995.
    [5] Hawrysh, Evan M., and Gordon W. Roberts. "An integration of memory-based analog signal generation into current DFT architectures." In Test Conference, 1996. Proceedings. International, pp. 528-537. IEEE, 1996.
    [6] Huang, Jiun-Lang, Chee-Kian Ong, and Kwang-Ting Cheng. "A BIST scheme for on-chip ADC and DAC testing." In Proceedings of the conference on Design, automation and test in Europe, pp. 216-220. ACM, 2000.
    [7] Xing, Hanqing, Hanjun Jiang, Degang Chen, and Randall L. Geiger. "High-resolution ADC linearity testing using a fully digital-compatible BIST strategy." Instrumentation and Measurement, IEEE Transactions on 58, no. 8 (2009): 2697-2705.
    [8] Duan, Jingbo, Degang Chen, and Randall Geiger. "Cost effective signal generators for ADC BIST." In Circuits and Systems, 2009. ISCAS 2009. IEEE International Symposium on, pp. 13-16. IEEE, 2009.
    [9] Huang, Jiun-Lang, and Kwang-Ting Cheng. "Testing and characterization of the one-bit first-order delta-sigma modulator for on-chip analog signal analysis." In Test Conference, 2000. Proceedings. International, pp. 1021-1030. IEEE, 2000..
    [10] Wen, Yun-Che, and Kuen-Jong Lee. "An on chip ADC test structure." In Proceedings of the conference on Design, automation and test in Europe, pp. 221-225. ACM, 2000..
    [11] Liang, Sheng-Chuan, and Hao-Chiao Hong. "A Digitally Testable Modulator Using the Decorrelating Design-for-Digital- Testability." Very Large Scale Integration (VLSI) Systems, IEEE Transactions on 19, no. 3 (2011): 503-507.
    [12] Dubois, Matthieu, Haralampos-G. Stratigopoulos, and Salvador Mir. "Ternary Stimulus for Fully Digital Dynamic Testing of SC S? ADCs." In Mixed-Signals, Sensors and Systems Test Workshop (IMS3TW), 2012 18th International, pp. 5-10. IEEE, 2012.
    [13] Ong, Chee-Kian, Kwang-Ting Cheng, and Li-C. Wang. "A new sigma-delta modulator architecture for testing using digital stimulus." Circuits and Systems I: Regular Papers, IEEE Transactions on 51, no. 1 (2004): 206-213.
    [14] Dufort, Benoit, and Gordon W. Roberts. "On-chip analog signal generation for mixed-signal built-in self-test." Solid-State Circuits, IEEE Journal of 34, no. 3 (1999): 318-330.
    [15] Kook, Sehun, Alfred Gomes, Le Jin, David Wheelright, and Abhijit Chatterjee. "Optimal Linearity Testing of Sigma-Delta Based Incremental ADCs Using Restricted Code Measurements." In Mixed-Signals, Sensors and Systems Test Workshop (IMS3TW), 2011 IEEE 17th International, pp. 72-77. IEEE, 2011.
    [16] Hung, Shao-Feng, and Hao-Chiao Hong. "A Fully Integrated BIST ADC Using the In-Phase and Quadrature Waves Fitting Procedure." Instrumentation and Measurement, IEEE Transactions on 63, no. 12 (2014): 2750-2760.
    [17] Ahmad, Shakeel, and Jerzy Døbrowski. "On-chip spectral test for high-speed ADCs by ΣΔ technique." In Circuit Theory and Design (ECCTD), 2011 20th European Conference on, pp. 661-664. IEEE, 2011.
    [18] Yong-sheng, Wang, Wang Jin-xiang, Lai Feng-chang, and Ye Yi- zheng. "A low-cost BIST scheme for ADC testing." In ASIC, 2005. ASICON 2005. 6th International Conference On, vol. 2, pp. 694- 698. IEEE, 2005.
    [19] Mir, Salvador. "A SNDR BIST for\ Sigma\ Delta Analogue-to- Digital Converters." In null, pp. 314-319. IEEE, 2006.
    [20] Bandopadyay, T. K., Manish Saxena, and Raghav Shrivastava. "Sigma Delta Modulator with Improved Performance through Evolutionary Algorithm." International Journal of Science and Research (IJSR) Volume 2 Issue 3, March 2013.
    [21] Benabes, Philippe. "Accurate time-domain simulation of continuous-time sigma–delta modulators." Circuits and Systems I: Regular Papers, IEEE Transactions on 56.10 (2009): 2248-2258.
    [22] C. H. E. N. Zhicai, Mathew Bond, and Nijad Anabtawi. "Design of a Second Order Continuous Time Sigma Delta Modulator with Improved Dynamic Range." Final Project of Oversampling Class, Fall 2007 Arizona State University.
    [23] Hart, Adam, and Sorin P. Voinigescu. "A 1 GHz Bandwidth Low- Pass ADC with 20–50 GHz Adjustable Sampling Rate." Solid- State Circuits, IEEE Journal of 44.5 (2009):
    [24] Toner, Michael F., and Gordon W. Roberts. "A BIST Scheme for an SNR Test of a Sigma-Delta ADC." Test Conference, 1993. Proceedings. International. IEEE, 1993.
    [25] Rolindez, Luis, “A SNDR BIST for/spl Sigma//spl Delta/analogue- to-digital converters." VLSI Test Symposium, 2006. Proceedings. 24th IEEE. IEEE, 2006.
    [26] Prateek Verma, Anil Kumar Sahu, Dr. Vivek Kumar Chandra, Dr. G.R.Sinha. A Graphical User Interface Implementation of Second Order Sigma- Delta Analog to Digital Converter with Improved Performance Parameters, International Journal For Research In Applied Science And Engineering Technology ,Vol. 2 Issue VII, July 2014.
    [27] Sahu, Anil Kumar, Vivek Kumar Chandra, and G. R. Sinha. "System Level Behavioral Modeling of CORDIC Based ORA of Built-in-Self-Test for Sigma-Delta Analog-to-Digital Converter." International Journal of Signal and Image Processing Issues 2015, no. 2 (2016).
    [28] Sahu, Anil Kumar, Chandra, Vivek Kumar, et. Sinha, G. R. “A Review on System Level Behavioral Modeling and Post Simulation of Builtin-Self-Test of Sigma-Delta Modulator Analog- to-Digital Converter”International Journal on Recent and Innovation Trends in Computing and Communication, vol. 3 no. 2, pp. 206-209.
    [29] Sahu, Anil Kumar, Chandra, Vivek Kumar, et SINHA, G. R. “Improved SNR and ENOB of SigmaDelta Modulator for Post Simulation and High Level Modeling of Built-in-Self Test Scheme.” 2015 International Journal of Computer Applications (0975 – 8887) Applications of Computers and Electronics for the Welfare of Rural Masses (ACEWRM) 2015, pp. 11-14.
    [30] Fitzgibbon Brain, Michal Peter Kennedy, and Franco Maloberti, "Hardware Reduction In Digital Delta Modulator Via Bus - Splitting and Error Masking-Part Ii:Non constant Input," IEEE transactions On Circuit And Systems, vol. 59, no. 9, pp. 1980- 1991, September 2012.
    [31] Fitzgibbon Brain, Michal Peter Kennedy, and Franco Maloberti, "Hardware Reduction In Digital Delta Modulator Via Bus - Splitting and Error Masking-Part Ii:Non constant Input," IEEE transactions On Circuit And Systems, vol. 59, no. 9, pp. 1980- 1991, September 2012.
    [32] Philipee Benabes and catalin Adrian Tugui, "Effective Modeling of CT Functions For Fast simulation Using MATALB/SIMULINK And VHD -AMS Applied to Sigma Delta Architectures," IEEE Conference on communication system and Networking Technology, pp. 2269-2272, 2011.
    [33] Drago Strle and Janez Trontelj, "High Level Simulation of Real Time BIST of Sigma Delta A/D Converters," International Conference on Synthesis ,Modelling ,Analysis And Simulation Method And applictaion To Circuit Design , pp. 285-289, 2012.
    [34] Hao Chiao Hong, Sheng Chaun Liang, and Hong Chin Song, "A Built in Self-Test Sigma Delat ADC Prototype," J. Electon Test, vol. 25, pp. 145-156, 2009.
    [35] Sheikh Saine, Julian Raczkowycz, and Peter Mather, "An Analogue Test Response Compaction Techinque Using Delta - Sigma Modulation ," Microelectonics Journal , vol. 32, pp. 339- 350, 2001.

Anil Kumar Sahu, Vivek Kumar Chandra and G R Sinha (2016), Optimized System Level Hardware Realization of Built-in-Self-Test Approach for Sigma-Delta Analog-to-Digital Converter. IJEER 4(3), 85-90. DOI: 10.37391/IJEER.040305.