I. J. of Electrical & Electronics Research
Research Article | 
Performance Analysis of Feature Extraction Approach: Local Binary Pattern and Principal Component Analysis for Iris Recognition system
Author(s) : C D Divya1and Dr. A B Rajendra2
Published In : International Journal of Electrical and Electronics Research (IJEER) Volume 10, Issue 2
Publisher : FOREX Publication
Published : 05 May 2022
e-ISSN : 2347-470X
Page(s) : 57-61
Abstract
Many techniques have been proposed for the recognition of Iris. Most of them are single resolution techniques which results in poor performance. In this paper, feature extraction approaches like local binary pattern and principal component analysis assimilation has been offered. For classification, Support Vector Machine has been used. This paper compares the efficiency of two popular feature extraction methods Principal Component Analysis and Local Binary Pattern using two different iris databases CASIA and UBIRIS. The models were tested using 200 iris images. Statistical parameters like F1 score and Accuracy are tested for different threshold values. Our proposed method results with accuracy of 94 and 92%, is obtained for using Local Binary Pattern for CASIA and UBIRIS data set respectively. The Receiver Operating Characteristic Curve has been drawn and Area under Curve is also calculated. The experiment has been extended by varying the dataset sizes. The result shows that LBP achieves better performance with both CASIA and UBIRIS databases compared to PCA.
Keywords: Area Under Curve, Local Binary Pattern, Iris, Principal Component Analysis, Feature Extraction, F1 Score, Receiver Operating Characteristic Curve, Receiver Operating Characteristic Curve, Support Vector Machine
C D Divya, AP, DoCS, VVCE, Mysuru, Karnataka, India ; Email: divyacd@vvce.ac.in
Dr. A B Rajendra, Prof, DoIS, VVCE, Mysuru, Karnataka, India
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C D Divya and Dr. A B Rajendra (2022), Performance Analysis of Feature Extraction Approach: Local Binary Pattern and Principal Component Analysis for Iris Recognition system. IJEER 10(2), 57-61. DOI: 10.37391/IJEER.100201. [Cross Ref]