I. J. of Electrical & Electronics Research
Research Article | 
Behavioral Dynamics of High Impedance Fault Under Different Line Parameters
Author(s) : S. Lavanya1, S. Prabakaran2 and N. Ashok Kumar3
Published In : International Journal of Electrical and Electronics Research (IJEER) Volume 10, Issue 2, Special Issue on IEEE-SD
Publisher : FOREX Publication
Published : 30 June 2022
e-ISSN : 2347-470X
Page(s) : 370-374
Abstract
Predominantly the impedance faults can be classified as Low Impedance Faults (LIF) and High Impedance Faults (HIF). The LIF can be detected and protected by a conventional protective device. However, if High impedance fault occurs in the system, it is difficult to detect because of the low magnitude current. The overcurrent relay, which smartly detects the Low impedance faults, fails to detect the High impedance faults. This research work is organized as two components. In the first component some literatures regrading high impedance fault have been reviewed. In the second component classical modified several Emmanuel arc model is taken as the test system. Feeder number four is taken as the candidate feeder for testing the high impedance faults. The simulation is done through MATLAB and the results are obtained. From the results certain investigations are proposed
Keywords: High Impedance Fault, Low magnitude current, HIF characteristics
S. Lavanya, Research Scholar, Department of EEE, Sri Chandrasekharendra Saraswathi Viswa Mahavidyalaya, Kanchipuram, India; Email: lavanya@kanchiuniv.ac.in
S. Prabakaran, Associate Professor, Department of EEE, Sri Chandrasekharendra Saraswathi Viswa Mahavidyalaya, Kanchipuram, India; Email: prabakaran@kanchiuniv.ac.in
N. Ashok Kumar, Assistant Professor, Department of EEE, Sri Chandrasekharendra Saraswathi Viswa Mahavidyalaya, Kanchipuram, India; Email: ashokeee@kanchiuniv.ac.in
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S. Lavanya, S. Prabhakaran and N. Ashok Kumar (2022), Behavioral Dynamics of High Impedance Fault Under Different Line Parameters. IJEER 10(2), 370-374. DOI: 10.37391/IJEER.100251.