Research Article |
Deep Neural Learning based Deming Regression Adder Enhancement on Digital Multiplier for 3D Graphical Applications in VLSI Circuits
Author(s): M. Renuka1 and G. Mary Valantina2
Published In : International Journal of Electrical and Electronics Research (IJEER) Volume 11, Issue 2
Publisher : FOREX Publication
Published : 30 April 2023
e-ISSN : 2347-470X
Page(s) : 242-252
Abstract
This work aims to investigate 3D Technology to provide better performance enhancement for several generations. The three-dimensional integrated circuit allows better integration density, faster on-chip communications, and heterogeneous integration. The goal of this research is to reduce time consumption and power consumption by introducing the Deep Neural Learnt Deming Regression Based Ladner-Fisher Adder Enhancement (DNLDR-LFAE) Technique in VLSI circuits. Input information (carry inputs) is taken for input layer and transmits to hidden layer 1. Deeming regression analysis has performed at hidden layer 1 to pre-process input data and it is send to hidden layer 2. In that layer, performs carry generation as well as post-processing as well as output outcomes have enclosed with convolution. Finally, at output layer, outcomes were attained to execute well-organized adder improvement of digital multiplier by lesser power as well as time consumption. DNLDR-LFAE Technique measured in terms of power, location and time consumption. An outcome of DNLDR-LFAE Technique decreases time and power consumption of adder enhancement than other methods. The hardware complexity of proposed technique obtains minimized by upto 52% to 63% when designed by Ladner-Fisher Adder.
Keywords: Very Large Scale Integration
, Integrated Circuit
, Ladner-Fischer
, Adder Enhancement
, Carry Generation
.
M. Renuka*, Research Scholar, Department of ETCE, Sathyabama Institute of Science and Technology, Chennai, India; Email: mannrenu1@gmail.com
G. Mary Valantina, Associate Professor, Department of CSE, Saveetha school of engineering , Chennai, India
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