Abstract

The multiplication operations are pivotal in (Application-Specific Integrated Circuits) ASICs and Digital Signal Processors (DSPs). The integration of Field-Programmable Gate Arrays (FPGAs) into modern embedded systems, efficient Built-in Self-Tests (BISTs), particularly for complex components like DSP slices, is essential. This paper evaluates Pseudo Random Binary Sequence (PRBS) generators and checkers as BIST tools for high-speed data transfers in FPGAs. The design achieves minimal errors and remarkable efficiency with less than 4% logic utilization within available Look-Up Tables (LUTs). The testing of embedded multipliers in modern FPGAs is analyzed, shedding light on their performance. The analysis includes Built-in Self-Test (BIST), PRBS generator, PRBS checker, and Bit Error Rate (BER), providing insights into FPGA-based testing. This analysis assesses PRBS tools for high-speed FPGA data transfers. A hybrid multiplier design, featuring BIST and PRBS capabilities, notably reduces DSP slice utilization from 16% to 5%. This liberated FPGA resource enhances operational capabilities. The runtime PRBS data control at the block level design exemplifies adaptability in FPGA testing. The findings underscore PRBS-based BIST potential in FPGA testing. The hybrid multiplier not only optimizes FPGA resources but also aligns with dynamic digital system requirements. This research aids FPGA designers and engineers in advanced testing strategies for evolving embedded systems.